EW: In conversation with Siemens: SSN and next-gen design-for-test technology

We recently had the opportunity to catch up with Lee Harrison, Director of Product Marketing for Siemens EDA, to talk about Streaming Scan Network (SSN) buses and the next-generation of design-for-test technology.

In the interview, for example, he discusses the significant changes involved with SSN, de-coupling complexity and dependencies, and delivering test-pattern content in a packetised format. Watch the interview below:

Thank you to Lee for his time.

Video: David Berman, emap

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