Called AutoBuzz, the test capability can be used to acquire a connectivity map of any board’s boundary-scan to boundary-scan pin connections (where these can be direct or via ‘transparent’ devices such as series resistors).
It works by learning a known good board and comparing its connectivity map with other test boards.
Suspected faulty boards can then be scanned by AutoBuzz in Compare mode, and a comparison is automatically made of their connectivity maps. Differences between the two maps are highlighted to indicate possible faults such as interconnect short-circuits, open-circuits or ‘stuck-at’ faults.
For added reliability and reproducibility a constraints section allows critical pins to be set at fixed drive values as ‘guards’.
Since the user requires no boundary-scan technical knowledge and with only a basic scan chain input needed, AutoBuzz is expected to find favour in repair and service centres as well as other debug arenas.
With only JTAG scan-chain information plus BSDL models of the JTAG/IEEE std 1149.1 compliant parts (available from manufacturers’ web-sites), users of AutoBuzz will be able to connect to their designs via a number of compatible JTAG interface options.
Supported interfaces currently include Altera’s USB Blaster, Xilinx’s parallel III/IV and USB interfaces, JTAG Technologies’ JT 3705 / USB controller, JTAGLive dedicated USB controller and some FTDI based modules.
AutoBuzz is available to buy online from www.jtaglive.com and is priced at €1495.