The instrument’s bandwidth of up to 160MHz allows it to be used for measurement of wideband, hopping and chirp signals, as used in wireless standards such as the 802.11ac
Testing
MathWorks gives Matlab speedy Windows boot
For Matlab there is now a fast start-up capability on Windows. There is a capability to read and write portions of arrays from MAT-files as well as a new spreadsheet import tool
Agilent claims first for PCIe 3.0 protocol tester
The 8GT/s operating speed of PCIe 3.0 devices can present a signal integrity challenges for designers. “Signal integrity problems may present themselves as errors in protocol behaviour,” said Agilent
Aim-TTi works with Cambridge University on micro fluxgate current probe
The fluxgate magnetometer uses technology developed in conjunction with Cambridge University and has a bandwidth of 5MHz combined with low noise and wide dynamic range
First scope and spectum analyser in one box
Tektronix has combined the function of an oscilloscope and a spectrum analyser in a single instrument, calling it a mixed domain oscilloscope. Called MDO4000, its two personas are broadly integrated allowing, for example, the...
Tektronix launches its ‘fastest’ oscilloscope
Tektronix has announced its fastest oscilloscopes to date with real time sampling rates up to 100GS/s on two channels and 33GHz analogue bandwidth on four channels
Microlease operates from large new facility
Microlease has announced that it is now operating from its new 27,000 square foot facility at Waverly Industrial Park in Harrow, Middlesex
Testing investments: Build the business rationale
A couple of decades ago technology investments were classified as a cost of doing business, a cost- centre-centric view. In today’s world, the new paradigm is a 180-degree turn-around, with technology being a profit centre, adding business value through the delivery of software and software products to the market place.
TRaC moves approvals process up the design cycle
The intention is to alert designers to the issue of product certification at an early stage in product development cycle so as to avoid problems in the final testing, approvals and certification phase
Meeting the challenge of over-the-air MIMO testing
Multiple-Input-Multiple-Output (MIMO) antenna techniques are a key factor in achieving the high data rates promised by next-generation wireless technologies such as LTE and LTE-Advanced. These new techniques impose significant challenges on the design and development of wireless devices, greatly complicating the associated RF testing.