Big data is big focus at NIWeek

NIWeek, the annual design and test technology conference presented by National Instruments starts in Austin, Texas today (August 4).

Dr James Truchard, president and CEO, National Instruments

Conference papers will discuss the application of NI’s design and measurement technologies including LabView, software-defined systems and CompactRIO in areas such as automotive and telecommunications to robotics and energy.

Specific topics at this year’s event include dealing with big data generated by analogue measurement systems.

Companies will describe how they are connecting IT infrastructures and analytic tools, such as the cloud, with data acquisition systems to make faster decisions on test data and work more efficiently.

Another focus area will be cyber physical systems and delegates from universities and industry will talk about new developments in cyber physical systems, how they are addressing technology gaps in this area.

Daily reports on the conference will be post don the NI Community website.