Electronics Weekly Electronics Design & Components Tech News
Entitled ‘The latest in XRF coatings analysis equipment for micro-scale semiconductor packaging’, it runs on Tuesday 6th October, at 14:00 GMT. It’s free for those who register in advance.
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“The scale of semiconductor device and micro-electronics that we see today makes producing reliable electronics coatings a significant challenge. X-ray fluorescence (XRF) is the established method for verifying the composition and thickness of coatings on electronic devices.
However, as devices reduce in size, XRF has to adapt to meet these new challenges. We are undoubtedly pushing XRF beyond traditional limits when we use it to measure electronics coating, which means it’s crucial to get everything right for accurate and precise measurements.”
It will be presented by Matt Kreiner, Product Manager at Hitachi High-Tech – he looks to answer how you can be sure that you are getting the accuracy and precision you need at a sub-micron level. He will be covering:
- A brief introduction to XRF as a technique, both for resolution of features and elemental range.
- Applications of XRF in the semiconductor and electronics industry.
- What you should do to make XRF analysis easier and more productive.
